Диссертация (1150742), страница 16
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Автор надеется, что результаты диссертационной работыпомогут в разработке электронных устройств на основе графена и графенсодержащих систем.112Список сокращений и обозначенийФЭС – фотоэлектронная спектроскопия (PES)РФЭС – рентгеновская фотоэлектронная спектроскопия (XPS)УФЭС – ультрафиолетовая фотоэлектронная спектроскопия (UPS)ФЭСУР – фотоэлектронная спектроскопия с угловым разрешением (ARPES)ФЭСУР со спиновым разрешением – фотоэлектронная спектроскопия с угловым и спиновым разрешением (SARPES)ДМЭ – дифракция медленных электронов (LEED)CТМ – сканирующая туннельная микроскопия или сканирующий туннельный микроскоп (STM)ЗБ – зона Бриллюэна (BZ)PES – Photoelectron Spectroscopy (ФЭС)XPS – X-ray Photoelectron Spectroscopy (РФЭС)SEM – Scanning Electron Microscopy (СЭМ)SARPES – Spin- and Angle- Resolved Photoemission Spectroscopy (ФЭСУРсо спиновым разрешением)ARPES – Angle-Resolved Photoelectron Spectroscopy(ФЭСУР)DFT – Density Functional TheoryCVD – Chemical Vapor Deposition – первичная энергия электронного пучка (например, для получения картины ДМЭ) – уровень Ферми – точка ДиракаΔ – величина спин-орбитального ресщепления113ML – монослой (слой моноатомной толщины)MG – графен (graphene)ВОПГ – высоко ориентированный пиролитический графит (HOPG)/ – “на поверхности” (используется для обозначения слоистых систем, например, MG/Bi – графен на поверхности Bi)отн.
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