Диссертация (1150372), страница 32
Текст из файла (страница 32)
Hartung,N. D. Spencer, D. Gunther // Anal. Chem. – 2007. – V. 79 – Is. 6 – P. 2325–2333.59. Marcus R.K. et al. Glow discharge plasmas in analytical spectroscopy / R. K. Marcus, J. A. C.Broekaert – Chichester: John Wiley & Sons, Ltd, 2003.– 498p.60. Winchester M.R. et al.
Radio-frequency glow discharge spectrometry : A critical review / M. R.Winchester, R. Payling // Spectrochim. Acta, Part B – 2004. – V. 59 – P. 607–666.61. Pisonero J. et al. Radiofrequency glow-discharge devices for direct solid analysis. / J. Pisonero, J.M. Costa, R. Pereiro, N. Bordel, A.
Sanz-Medel // Anal. Bioanal. Chem. – 2004. – V. 379 – Is. 1 – P.17–29.62. Caballero R. et al. Comprehensive Comparison of Various Techniques for the Analysis ofElemental Distributions in Thin Films / R. Caballero, C. Fischer, C. A.
Kaufmann, I. Lauermann, R.Mainz, H. Monig, A. Schopke, C. Stephan, C. Streeck, S. Schorr, A. Eicke, M. Dobeli, B. Gade, J.Hinrichs, T. Nunney, H. Dijkstra, V. Hoffmann, D. Klemm, V. Efimova, A. Bergmaier, G. Dollinger,T. Witrh, W. Unger, A. A. Rockett, A. Perez-Rodriguez, J.
Alvarez-Garcia, V. Izquerdo-Roca, T.Schmid, P.-P. Choi, M. Muller, F. Bertram, J. Christen, H. Khatri, R. W. Collins, S. Marsillac, I.Kotschau // Microsc. Microanal. – 2011. – V. 17 – P. 728–751.63. Hodoroaba V.D. et al. Depth profiling of electrically non-conductive layered samples by RFGDOES and HFM plasma SNMS / V. D. Hodoroaba, W. E. S. Unger, H. Jenett, V. Hoffmann, B.Hagenhoff, S. Kayser, K. Wetzig // Appl.
Surf. Sci. – 2001. – V. 179 – Is. 1-4 – P. 30–37.64. Fernandez B. et al. Glow discharge analysis of nanostructured materials and nanolayers-a review. /B. Fernandez, R. Pereiro, A. Sanz-Medel // Anal. Chim. Acta – 2010. – V. 679 – Is. 1-2 – P. 7–16.65. Hoffmann V. et al. Present possibilities of thin-layer analysis by GDOES / V. Hoffmann, R. Dorka,L. Wilken, V.
Hodoroaba, K. Wetzig // Surf. Interface Anal. – 2003. – V. 35 – P. 575–582.66. Shimizu K. et al. Rf-GDOES depth profiling analysis of a monolayer of thiourea adsorbed oncopper / K. Shimizu, R. Payling, H. Habazaki, P. Skeldon, G. E. Thompson // J. Anal. At. Spectrom –2004. – V. 19 – P. 692–695.16167. Shimizu K. et al. Impact of RF-GD-OES in practical surface analysis / K.
Shimizu, H. Habazaki, P.Skeldon, G. E. Thompson // Spectrochim. Acta, Part B – 2003. – V. 58 – Is. 3 – P. 1573–1583.68. Pisonero J. Glow discharge spectroscopy for depth profile analysis: from micrometer to subnanometer layers / J. Pisonero // Anal. Bioanal. Chem. – 2006. – V. 384 – Is. 1 – P. 47–49.69.
Engelhard C. et al. Correcting distortion in a monochromatic imaging spectrometer for applicationto elemental imaging by glow discharge-optical emission spectrometry / C. Engelhard, S. Ray // J.Anal. At. Spectrom. – 2010. – V. 25 – Is. 12 – P. 1874–1881.70. Gamez G. et al. Surface elemental mapping via glow discharge optical emission spectroscopy / G.Gamez, M. Voronov, S. J. Ray, V. Hoffmann, G. M. Hieftje, J. Michler // Spectrochim. Acta, Part B –2012.
– V. 70 – P. 1–9.71. Gamez G. et al. Push-broom hyperspectral imaging for elemental mapping with glow dischargeoptical emission spectrometry / G. Gamez, D. Frey, J. Michler // J. Anal. At. Spectrom. – 2012. – V.27 – P. 50–55.72. Voronov M. et al. Glow discharge imaging spectroscopy with a novel acousto-optical imagingspectrometer / M. Voronov, V. Hoffmann, T. Wallendorf, S. Marke, J. Monch, C.
Engelhard, W.Buscher, S. J. Ray, G. M. Hieftje // J. Anal. At. Spectrom. – 2012. – V. 27 – Is. 3 – P. 419–425.73. Lavoine V. et al. Optical interfaces in GD-OES system for vacuum far ultraviolet detection / V.Lavoine, H. Chollet, J.-C. Hubinois, S. Bourgeois, B. Domenichini // J. Anal. At. Spectrom. – 2003. –V. 18 – Is. 6 – P. 572–575.74. Alberts D. et al. Analytical performance of pulsed radiofrequency glow discharge optical emissionspectrometry for bulk and in-depth profile analysis of conductors and insulators / D.
Alberts, B.Fernandez, R. Pereiro, A. Sanz-Medel // J. Anal. At. Spectrom. – 2011. – V. 26 – Is. 4 – P. 776783.75. Pisonero J. et al. Glow-discharge spectrometry for direct analysis of thin and ultra-thin solid films /J. Pisonero, B. Fernandez, R. Pereiro, N. Bordel, A. Sanz-Medel // Trends Anal. Chem.
– 2006. – V.25 – Is. 1 – P. 11–18.76. Xhoffer C. et al. Application of glow discharge optical emission spectrometry in the steel industry /C. Xhoffer, H. Dillen // J. Anal. At. Spectrom. – 2003. – V. 18 – Is. 6 – P. 576–583.77. Becker J.S. Inorganic Mass Spectrometry: Principles and Applications / J. S. Becker – Chichester:John Wiley & Sons, Ltd, 2007.– 496p.78. Bacon J.R. et al. Spark-source mass spectrometry: recent developments and applications. / J. R.Bacon, A. M. Ure // Analyst – 1984. – V. 109 – Is.
10 – P. 1229–1254.79. Taylor S.R. et al. Geochemical application of spark source mass spectrography—III. Elementsensitivity, precision and accuracy / S. R. Taylor, M. P. Gorton // Geochim. Cosmochim. Acta – 1977.– V. 41 – Is. 4 – P. 1375–1380.80. Jochum K.P. et al. Multi-ion counting-spark source mass spectrometry (MIC-SSMS): A newmultielement technique in geo- and cosmochemistry / K. P. Jochum, H. J. Laue, H.
M. Seufert, C.Dienemann, B. Stoll, J. Pfander, M. Flanz, H. Achtermann, A. W. Hofmann // Fresenius J. Anal.Chem. – 1997. – V. 359 – Is. 4-5 – P. 385–389.16281. Hergenroder R. et al. Femtosecond laser ablation elemental mass spectrometry / R. Hergenroder,O. Samek, V. Hommes // Mass Spectrom. Rev. – 2006. – V. 25 – P. 551–572.82.
Sysoev A.A. et al. Analysis of Bulk and Powdered Samples Using a LAMAS-10M LaserIonization Time-of-Flight Mass Spectrometer / A. A. Sysoev, S. S. Poteshin, G. B. Kuznetsov, I. A.Kovalev, E. S. Yushkov // J. Anal. Chem. – 2002. – V. 57 – Is. 9 – P. 811–820.83. Yu Q. et al. Laser ionization time-of-flight mass spectrometry for direct elemental analysis / Q.
Yu,L. Chen, R. Huang, W. Hang, B. Huang, J. He // Trends Anal. Chem. – 2009. – V. 28 – Is. 10 – P.1174–1185.84. Huang R. et al. High irradiance laser ionization orthogonal time-of-flight mass spectrometry: Aversatile tool for solid analysis / R. Huang, Q. Yu, L. Li, Y. Lin, W. Hang, J. He, B. Huang // MassSpectrom.
Rev. – 2011. – V. 30 – Is. 6 – P. 1256–1268.85. Aubriet F. et al. Laser ablation and secondary ion mass spectrometry of inorganic transition-metalcompounds. Part I: comparison between static ToF-SIMS and LA-FTICRMS. / F. Aubriet, C.Poleunis, J.-F. Muller, P. Bertrand // J. mass Spectrom. – 2006. – V. 41 – Is. 4 – P. 527–542.86.
Koch J. et al. Review of the State-of-the-Art of Laser Ablation Inductively Coupled Plasma MassSpectrometry / J. Koch, D. Gunther // Appl. Spectrosc. – 2011. – V. 65 – Is. 5 – P. 155–162.87. Knight A.K. et al. The development of a micro-Faraday array for ion detection / A. K. Knight, R.P. Sperline, G. M.
Hieftje, E. Young, C. J. Barinaga, D. W. Koppenaal, M. B. Denton // Int. J. MassSpectrom. – 2002. – V. 215 – Is. 1-3 – P. 131–139.88. Becker J.S. Applications of inductively coupled plasma mass spectrometry and laser ablationinductively coupled plasma mass spectrometry in materials science / J. S. Becker // Spectrochim. Acta,Part B – 2002. – V. 57 – Is. 12 – P. 1805–1820.89. Fernandez B. et al.
Direct analysis of solid samples by fs-LA-ICP-MS / B. Fernandez, F. Claverie,C. Pecheyran, O. F. X. Donard // Trends Anal. Chem. – 2007. – V. 26 – Is. 10 – P. 951–966.90. Günther D. et al. Elemental Analyses Using Laser Ablation-Inductively Coupled Plasma-MassSpectrometry (LA-ICP-MS) of Geological Samples Fused with Li2B4O7 and Calibrated WithoutMatrix-Matched Standards / D.
Günther, A. Quadt, R. Wirz, H. Cousin, V. J. Dietrich // Microchim.Acta – 2001. – V. 136 – Is. 3-4 – P. 101–107.91. Pisonero J. et al. Critical revision of GD-MS, LA-ICP-MS and SIMS as inorganic massspectrometric techniques for direct solid analysis / J. Pisonero, B. Fernandez, D. Gunther // J. Anal. At.Spectrom. – 2009. – V. 24 – Is. 9 – P. 1145–1160.92.
Gunther D. et al. Solid sample analysis using laser ablation inductively coupled plasma massspectrometry / D. Gunther, B. Hattendorf // Trends Anal. Chem. – 2005. – V. 24 – Is. 3 – P. 255–265.93. Xiaoming Q. et al. A large-scale copper ore-forming event accompanying rapid uplift of thesouthern Tibetan Plateau: Evidence from zircon SHRIMP U–Pb dating and LA ICP-MS analysis / Q.Xiaoming, H. Zengqian, K. Zaw, M. Xuanxue, X. Wenyi, X. Hongbo // Ore Geol. Rev. – 2009.
– V.36 – Is. 1-3 – P. 52–64.16394. Pearce N.J.G. et al. Trace-element microanalysis by LA-ICP-MS: The quest for comprehensivechemical characterisation of single, sub-10 μm volcanic glass shards / N. J. G. Pearce, W. T. Perkins,J. A. Westgate, S. C. Wade // Quat. Int. – 2011. – V. 246 – Is. 1-2 – P. 57–81.95. Hoesl S. et al. Development of a calibration and standardization procedure for LA-ICP-MS using aconventional ink-jet printer for quantification of proteins in electro- and Western-blot assays / S.Hoesl, B. Neumann, S.
Techritz, M. Linscheid, F. Theuring, C. Scheler, N. Jakubowski, L. Mueller //J. Anal. At. Spectrom. – 2014. – V. 29 – Is. 7 – P. 1282–1291.96. Margetic V. et al. Depth profiling of multi-layer samples using femtosecond laser ablation / V.Margetic, M. Bolshov, A. Stockhaus, K. Niemax, R. Hergenroder // J. Anal. At. Spectrom. – 2001. –V. 16 – P. 616–621.97. Jurowski K. et al. A standard sample preparation and calibration procedure for imaging zinc andmagnesium in rats’ brain tissue by laser ablation-inductively coupled plasma-time of flight-massspectrometry / K.
![](https://s.studizba.com/z.php?f=/templates/si/i/noavatar.png&w=100&h=100&t=1"){kind=avatar}
