Диссертация (1150372), страница 34
Текст из файла (страница 34)
Cells – 2010. – V. 94 – Is. 8– P. 1352–1357.138. Sabatino M. Di et al. Depth profile analysis of solar cell silicon by GD-MS / M. Di Sabatino, C.Modanese, L. Arnberg // J. Anal. At. Spectrom. – 2014. – V. 29 – Is. 11 – P. 2072–2077.139. Muniz A.C. et al. Pulsed radiofrequency glow discharge time of flight mass spectrometer for thedirect analysis of bulk and thin coated glasses / A. C. Muniz, J. Pisonero, L. Lobo, C. Gonzalez, N.Bordel, R. Pereiro, A. Tempez, P.
Chapon, N. Tuccitto, A. Licciardello, A. Sanz-Medel // J. Anal. At.Spectrom. – 2008. – V. 23 – Is. 9 – P. 1239–1246.140. Resano M. et al. Comparison of the solid sampling techniques laser ablation-ICP-MS, glowdischarge-MS and spark-OES for the determination of platinum group metals in Pb buttons obtainedby fire assay of platiniferous ores / M. Resano, E. Garcia-Ruiz, K. S. McIntosh, J. Hinrichs, I.Deconinck, F. Vanhaecke // J. Anal. At. Spectrom. – 2006. – V.
21 – Is. 9 – P. 899–909.141. Gibeau T.E. et al. Cryogenically cooled sample holder for polymer sample analysis byradiofrequency glow discharge mass spectrometry / T. E. Gibeau, M. L. Hartenstein, R. K. Marcus // J.Am. Soc. Mass Spectrom. – 1997. – V. 8 – Is. 12 – P. 1214–1219.142. Lobo L. et al. Quantitative depth profiling of boron and arsenic ultra low energy implants bypulsed rf-GD-ToFMS / L.
Lobo, B. Fernández, R. Pereiro, N. Bordel, E. Demenev, D. Giubertoni, M.Bersani, P. Honicke, B. Beckhoff, A. Sanz-Medel // J. Anal. At. Spectrom. – 2011. – V. 26 – Is. 3 – P.542–549.143. Reinsberg K. et al. Depth-profile analysis of thermoelectric layers on Si wafers by pulsed r.f.glow discharge time-of- flight mass spectrometry / K. Reinsberg, C.
Schumacher, A. Tempez, K.Nielsch, J. A. C. Broekaert // Spectrochim. Acta, Part B – 2012. – V. 76 – P. 175–180.144. Pisonero J. et al. Minor elements determination and evaluation of diffusion/segregation effects onultra-thin layers using pulsed-RF-GD-TOFMS / J. Pisonero, a Licciardello, a Hierro-Rodriguez, C.Quiros, a Sanz-Medel, N. Bordel // J.
Anal. At. Spectrom. – 2011. – V. 26 – Is. 8.167145. Tarik M. et al. A laser ablation millisecond-pulsed glow discharge time-of flight massspectrometer (LA-GD-TOFMS) for quasi-simultaneous elemental and molecular analysis / M. Tarik,D. Gunther // J. Anal. At. Spectrom. – 2010. – V. 25 – Is. 9 – P.
1416–1423.146. Betti M. Use of a Direct Current Glow Discharge Mass Spectrometer for the ChemicalCharacterization of Samples of Nuclear Concern / M. Betti // J. Anal. At. Spectrom. – 1996. – V. 11 –P. 855–860.147. Chartier F. et al. Comparison of the Performance of a Laboratory-built High Resolution GlowDischarge Mass Spectrometer With That of a Quadrupole Inductively Coupled Plasma (GlowDischarge) Mass Spectrometer for Boron and Gadolinium Isotopic Analysis / F. Chartier, M.
Tabarant// J. Anal. At. Spectrom. – 1997. – V. 12 – P. 1187–1193.148. Betti M. Isotope ratio measurements by secondary ion mass spectrometry (SIMS) and glowdischarge mass spectrometry (GDMS) / M. Betti // Int. J. Mass Spectrom. – 2005. – V. 242 – P. 169–182.149. Ганеев, А.А. Эффективная ионизация элементов с высокими энергиями ионизации пакетомвысокоэнергетичных электронов в импульсном тлеющем разряде с времяпролетнымдетектированием ионов и ее использование для послойного анализа хлора в сталях / А.
А.Ганеев, А. Р. Губаль, В. И. Мосичев, Н. В. Першин, В. Б. Бичаев, В. Н. Малышев, С. В. Потапов,К. Н. Усков // Масс-спектрометрия – 2012. – Т. 9 – № 4 – С. 269–276.150. Rubinshtein A. a et al. Characterization of a third-generation Faraday-strip array detector coupledto a Mattauch-Herzog geometry mass spectrograph with a dc-glow discharge ionization source / A. aRubinshtein, G. D. Schilling, S. J. Ray, R. P. Sperline, M. B. Denton, C. J. Barinaga, D. W.Koppenaal, G. M. Hieftje // J. Anal. At. Spectrom. – 2010. – V.
25 – Is. 5 – P. 735–738.151. Vieth W. et al. Relative sensitivity factors in glow discharge mass spectrometry. / W. Vieth, J. C.Huneke // Spectrochim. Acta, Part B B – 1991. – V. 46 – P. 137–153.152. Smith R.L. et al. Assessment of the Relative Role of Penning Ionization in Low-Pressure GlowDischarges / R. L. Smith, D. Serxner, K.
R. Hess // Anal. Chem. – 1989. – V. 61 – Is. 10 – P. 1103–1108.153. Adams F. et al. Inorganic mass spectrometry of solid samples / F. Adams, A. Vertes // FreseniusJ. Anal. Chem. – 1990. – V. 337 – P. 638–647.154. Saka T.S. et al. Correlation between the Relative Sensitivity Factors and the Sputtering Yields inGlow-Discharge Mass Spectrometry / T. S. Saka, M. I. Noue // Anal.
Sci. – 2000. – V. 16 – P. 653–655.155. Bogaerts A. et al. Relative sensitivity factors in glow discharge mass spectrometry: the role ofcharge transfer ionization / A. Bogaerts, R. Gijbels // J. Anal. At. Spectrom. – 1996. – V. 11 – P. 841–847.156. Bogaerts A. et al. Calculation of rate constants for asymmetric charge transfer, and their effect onrelative sensitivity factors in glow discharge mass spectrometry / A. Bogaerts, K. a.
Temelkov, N. K.Vuchkov, R. Gijbels // Spectrochim. Acta, Part B – 2007. – V. 62 – P. 325–336.157. Pajo L. et al. A novel isotope analysis of oxygen in uranium oxides: comparison of secondary ionmass spectrometry, glow discharge mass spectrometry and thermal ionization mass spectrometry / L.168Pajo, G. Tamborini, G. Rasmussen, K. Mayer, L. Koch // Spectrochim. Acta, Part B – 2001. – V. 56 –Is. 5 – P. 541–549.158.
Kasik M. et al. Quantification in trace and ultratrace analyses using glow discharge techniques:round robin test on pure copper materials / M. Kasik, C. Venzago, R. Dorka // J. Anal. At. Spectrom. –2003. – V. 18 – Is. 6 – P. 603–611.159.
Beyer C. et al. Development and analytical characterization of a Grimm-type glow discharge ionsource operated with high gas flow rates and coupled to a mass spectrometer with high mass resolution/ C. Beyer, I. Feldmann, D. Gilmour, V. Hoffmann, N. Jakubowski // Spectrochim. Acta, Part B –2002. – V.
57 – P. 1521–1533.160. Duckworth D.C. et al. Design and Characterization of a Radio-Frequency-Powered GlowDischarge Source for Double-Focusing Mass Spectrometers / D. C. Duckworth, D. L. Donohue, D. H.Smith, R. K. Marcus // Anal. Chem. – 1993. – V. 65 – Is. 6 – P.
2478–2484.161. Lewis C.L. et al. Determination of 40Ca+ in the presence of 40Ar+: an illustration of the utility oftime-gated detection in pulsed glow discharge mass spectrometry. / C. L. Lewis, E. S. Oxley, C. K.Pan, R. E. Steiner, F. L. King // Anal. Chem. – 1999. – V. 71 – Is. 1 – P. 230–234.162. Губаль, А.Р. Дискриминация газовых компонентов и кластеров во время-пролетной массспектрометрии с импульсным тлеющим разрядом / А. Р. Губаль, А. А. Ганеев, С.
В. Потапов, Р.В. Тюкальцев, А. Злоторович // Масс-спектрометрия – 2009. – Т. 6 – № 1 – С. 67–76.163. Sanchez P. et al. Influence of the hydrogen contained in amorphous silicon thin films on a pulsedradiofrequency argon glow discharge coupled to time of flight mass spectrometry.
Comparison withthe addition of hydrogen as discharge gas / P. Sanchez, D. Alberts, B. Fernandez, A. Menendez, R.Pereiro, A. Sanz-Medel // J. Anal. At. Spectrom. – 2012. – V. 27 – Is. 1 – P. 71–79.164. Hang W. et al. Microsecond pulsed glow discharge as an analytical spectroscopic source / W.Hang, W. O. Walden, W. W. Harrison // Anal. Chem. – 1996. – V. 68 – Is. 7 – P. 1148–1152.165.
Hang W. et al. Diffusion, Ionization, and Sampling Processes in the Glow Discharge Source forMass Spectrometry / W. Hang, W. W. Harrison // Anal. Chem. – 1997. – V. 69 – Is. 24 – P. 4957–4963.166. Yan X. et al. A spectroscopic investigation of the afterglow and recombination process in amicrosecond pulsed glow discharge / X. Yan, Y. Lin, R. Huang, W. Hang, W. W. Harrison // J. Anal.At. Spectrom. – 2010.
– V. 25 – Is. 4 – P. 534–543.167. Ohorodnik S.K. et al. Cryogenic coil for glow discharge sources. / S. K. Ohorodnik, W. W.Harrison // Anal. Chem. – 1993. – V. 65 – Is. 4 – P. 2542–2544.168. Lobo L. et al. A purged argon pre-chamber for analytical glow discharge—time of flight massspectrometry applications / L. Lobo, N. Bordel, R. Pereiro, a. Tempez, P. Chapon, a.
Sanz-Medel // J.Anal. At. Spectrom. – 2011. – V. 26 – Is. 4 – P. 798–803.169. Mei Y. et al. Getters as plasma reagents in glow discharge mass spectrometry. / Y. Mei, W. W.Harrison // Spectrochim. Acta, Part B – 1991. – V. 46 – Is. 2 – P. 175–182.169170. Woo J.C. et al. Analysis of Aluminium Oxide Powder by Glow Discharge Mass SpectrometryWith Low Mass Resolution / J. C. Woo, N. Jakubowski, D. Stuewer // J. Anal. At. Spectrom. – 1993. –V. 8 – P. 881–889.171. Schelles W. et al. The use of a secondary cathode to analyse solid non-conducting samples withdirect current glow discharge mass spectrometry: potential and restrictions / W.
Schelles, S. De Gendt,K. Maes, R. van Grieken // Fresenius J. Anal. Chem. – 1996. – V. 355 – P. 858–860.172. Milton D.M.P. et al. Investigations into the suitability of using a secondary cathode to analyseglass using glow discharge mass spectrometry / D. M. P. Milton, R. C. Hutton // Spectrochim. Acta,Part B – 1993. – V. 48 – Is. 1 – P. 39–52.173.
Schelles W. et al. Direct Current Glow Discharge Mass Spectrometric Analysis of MacorCeramic Using a Secondary Cathode / W. Schelles, R. E. Van Grieken // Anal. Chem. – 1996. – V. 68– P. 3570–3574.174. Schelles W. et al. Quantitative Analysis of Zirconium Oxide by Direct Current Glow DischargeMass Spectrometry Using a Secondary Cathode / W. Schelles, R. van Grieken // J. Anal. At.
Spectrom.– 1997. – V. 12 – P. 49–52.175. Schelles W. Direct Current Glow Discharge Mass Spectrometry for Elemental Characterization ofPolymers / W. Schelles // Anal. Chem. – 1997. – V. 69 – P. 2931–2934.176. Schelles W. et al. Evaluation of Secondary Cathodes for Glow Discharge Mass SpectrometryAnalysis of Different Nonconducting Sample Types / W. Schelles, S. De Gendt, V. Muller, R. vanGrieken // Appl.
![](https://s.studizba.com/z.php?f=/templates/si/i/noavatar.png&w=100&h=100&t=1"){kind=avatar}
