Диссертация (1097499), страница 34
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Maxwell Garnett J.C. Colours in metal glasses and in metallic lms //Phil. Trans. R. Soc. Lond. 1904. V. 203. P. 385-42023477. Bruggeman D. A. G. Berechnung verschiedener physikalisher Konstantenvon heterogen Substanzen // Ann. Phys.(Leipzig). 1935. V. 24.P. 634664.78. Ëàíäàó Ë.
Ä. , Ëèôøèö Å. Ì. Ýëåêòðîäèíàìèêà ñïëîøíûõ ñðåä. Ì.:Ôèçìàòëèò, 2003. 656 c.79. Looyenga H. Dielectric constants of heterogeneous mixtures // Physica.1965. V. 31. P. 401-406.80. Bergman D. J. The dielectric constant of a composite material - a problemin classical physics // Phys. Rep. 1978. V. 43. P.377.81. Âèíîãðàäîâ À.Ï. Ýëåêòðîäèíàìèêà êîìïîçèòíûõ ìàòåðèàëîâ. Ì.:ÓÐÑÑ, 2001. 208 c.82.
Âåíãåð . Ô., Ãîí÷àðåíêî À. Â., Äìèòðóê Ì. Ë. Îïòèêà ìàëèõ ÷àñòèíîê i äèñïåðñíèõ ñåðåäîâèù. Êèâ: Íàóêîâà äóìêà. 1999. 348 c.83. Spanier J. E., Herman I. P. Use of hybrid phenomenological and statisticaleective-medium theories of dielectric functions to model the infraredreectance of porous SiC lms // Phys. Rev.
B.- 2000.-V. 61, No. 15.P. 10437 10450.84. Ghiner A. V., Surdutovich G. I. Method of integral equations and anextinction theorem for two-dimensional problems in nonlinear optics //Phys. Rev. A. 1994. V. 50, No.1. P. 71472385. Kovalev D., Heckler H., Polisski G., Koch F. Optical Properties of SiNanocrystals // Phys. Stat.
Sol. (b). 1999. V. 215. P. 871-932.86. Bisi O., Ossicini S., Pavesi L., Porous Silicon: a Quantum Sponge Structurefor Silicon Based Optoelectronics // Surface Science Reports. 2000. V.38, 1-126 .23587. Ñòðàøíèêîâà Ì.È., Âîçíûé Â.Ë., Ðåçíè÷åíêî Â.ß., Ãàéâîðîíñêèé Â.ß.Îïòè÷åñêèå ñâîéñòâà ïîðèñòîãî êðåìíèÿ // ÆÝÒÔ. 2001. T.120,2(8). Ñ.409-413.88. Ãîëîâàíü Ë.À., Êîíñòàíòèíîâà À.Ô., Èìàíãàçèåâà Ê.Á., Êðóòêîâà Å.Þ., Òèìîøåíêî Â.Þ., Êàøêàðîâ Ï.Ê. Äèñïåðñèÿ îïòè÷åñêîé àíèçîòðîïèè â ïëåíêàõ íàíîñòðóêòóðèðîâàííîãî êðåìíèÿ //Êðèñòàëëîãðàôèÿ. 2004.
Ò. 49, 1. Ñ. 174-17889. Kunzner N., Diener J., Gross E., Kovalev D., Timoshenko V. Yu., FujiiM. Form birefringence of anisotropically nanostructured silicon // Phys.Rev. B . 2005. V. 71, No.19. P. 195304-1 - 195304-8.90. Kochergin V., Christophersen M., Foll H. Eective medium approach forcalculations of optical anisotropy in porous materials // Appl. Phys. B.2004. V. 79, P.
731739.91. Òàìì È. Å. Îñíîâû òåîðèè ýëåêòðè÷åñòâà. Ì.: Ôèçìàòëèò, 2003. 616 c.92. Êèòòåëü ×. Ôèçèêà òâåðäîãî òåëà. Ì.: Íàóêà, 1990. 789 c.93. Meier M., Wokaun A. Enhanced elds on large metal particles: dynamicdepolarization // Opt. Lett.
1983. V. 8, No. 11. P. 581-583.94. Wokaun A., Gordon J.P., Liao P.F. Radiation damping in surfaceenhanced Raman scattering // Phys. Rev. Lett. 1982. V. 48, No. 14. P. 957-960.95. Martin O.J.F., Piller N.B. Electromagnetic scattering in polarizablebackgrounds // Phys. Rev.
E. 1998. V. 58, No. 3. P. 3909-3915.96. Draine B.T. The discrete-dipole approximation and its application tointerstel- lar graphite grains // Astrophys. J. 1988. V. 333. P. 848872.23697. Soller B. J., Hall D. G. Dynamic modications to the plasmon resonance ofa metallic nanoparticle coupled to a planar waveguide: beyond the pointdipole limit // J. Opt. Soc. Am. B. 2002 . 19, No.5 .
P. 1195-1203.98. Mallet P., Guerin C. A., Sentenac A. Maxwell-Garnett mixing rule in thepresence of multiple scatttering: Derivation and accuracy // Phys. Rev.B. 2005. V. 72, No. 1. P. 014205-1 - 014205-9.99. Guerin C. A., Mallet P., Sentenac A. Eective-medium theory for nitesize aggregates // J. Opt. Soc. Am. 2006. V. 23, No. 2. P. 349-358.100.
Çàáîòíîâ Ñ.Â. Ôîòîííûå ñðåäû íà îñíîâå íàíî - è ìèêðîñòðóêòóðèðîâàííîãî êðåìíèÿ. Äèññ. ... êàíä. ôèç.-ìàò. íàóê. Ì.: ÌÃÓ, 2006. 122 c.101. Kozlov G., Volkov A.A. Coherent source submillimeter wave spectroscopy./ in G. Gruner (Ed.) . Millimeter and Submillimeter Wave Spectroscopyof Solids. Berlin: Springer, 1998 . P. 51 110.102. Ñòðýòòîí Äæ. Òåîðèÿ ýëåêòðè÷åñòâà. Ì.:ÃÈÒÒË, 1947. 538 c.103. Ñòðàøíèêîâà M. È. Îá èçìåðåíèè äèñïåðñèè ïîêàçàòåëÿ ïðåëîìëåíèÿïîðèñòîãî êðåìíèÿ // Îïòèêà è ñïåêòðîñêîïèÿ.
2002. Ò. 93, 1 .Ñ. 142104. Pastrnak J., Vedam K. Optical anisotropy of silicon single crystal // Phys.Rev. B . 1971. V. 3, No. 8. P. 2567 - 2574.105. Êîìïàí Ì. Å., Ñàëîíåí ß., Øàáàíîâ È. Þ. Àíîìàëüíîå äâóëó÷åïðåëîìëåíèå ñâåòà â ñâîáîäíûõ ïëåíêàõ ïîðèñòîãî êðåìíèÿ // ÆÝÒÔ.2000. Ò. 117, 2. Ñ. 368 - 374.106. Ñàðáåé O.
Ã., Ôðîëîâà E. K., Ôåäîðîâè÷ Ð. Ä., Äàíüêî Ä. Á. Äâóëó÷åïðåëîìëåíèå ïîðèñòîãî êðåìíèÿ // ÔÒÒ. 2000. Ò. 42, âûï. 7. Ñ. 1205-1206.237107. Kovalev D., Polisski G., Diener J., Heckler H., Kunzner N., TimoshenkoV. Yu., Koch F. Strong in-plane birefringence in nanostructured silicon //Appl. Phys. Lett. 2001. V. 78. P. 916918 .108. Êóçíåöîâà Ë.Ï., Åôèìîâà À.È., Îñìèíêèíà Ë.À., Ãîëîâàíü Ë.À.,Òèìîøåíêî Â.Þ., Êàøêàðîâ Ï.Ê. Èññëåäîâàíèå äâóëó÷åïðåëîìëåíèÿ â ñëîÿõ ïîðèñòîãî êðåìíèÿ ìåòîäîì èíôðàêðàñíîé Ôóðüåñïåêòðîñêîïèè // ÔÒÒ.
2002. Ò. 44, âûï. 5. Ñ. 780-784.109. Ïèñêóíîâ Í.À., Çàáîòíîâ Ñ.Â., Ìàìè÷åâ Ä.À., Ãîëîâàíü Ë.À., Òèìîøåíêî Â.Þ., Êàøêàðîâ Ï.Ê. Ìîäèôèêàöèÿ äâóëó÷åïðåëîìëÿþùèõñâîéñòâ íàíîñòðóêòóðèðîâàííîãî êðåìíèÿ ïðè èçìåíåíèè óðîâíÿ ëåãèðîâàíèÿ ïîäëîæêè áîðîì // Êðèñòàëëîãðàôèÿ.
2007. Ò. 52, 4.Ñ. 711-715.110. Mihalcescu I., Lerondel G., Romestain R. Porous silicon anisotropyinvestigated by guided light // Thin Solid Films. 1997. V. 297, No. 1-2.P. 245-249.111. Timoshenko V.Yu., Osminkina L.A., Emova A.I., Golovan L.A.,Kashkarov P.K., Kovalev D., Kunzner N., Gross E., Diener J., Koch F.Anisotropy of optical absorption in birefringent porous silicon // Phys.Rev. B. 2003. V. 67, No. 11. P. 113405-1 - 113405-4112. Âîðîíêîâà Å. Ì., Ãðå÷óøíèêîâ Á. Í., Äèñòëåð Ã.È. è äð. Îïòè÷åñêèåìàòåðèàëû äëÿ èíôðàêðàñíîé òåõíèêè, Ì.: Íàóêà, 1965.
332 c.113. Aspnes D. E., Studna A. A. Dielectric functions and optical parametersof Si, Ge, GaP, GaAs, GaSb, InP, and InSb from 1.5 to 6.0 eV // Phys.Rev. B. 1983. V. 27, No.2. P. 985-1009.114. Åôèìîâà À.È., Êðóòêîâà Å.Þ., Ãîëîâàíü Ë.À., Ôîìåíêî Ì.À., Êàøêàðîâ Ï.Ê., Òèìîøåíêî Â.Þ. Äâóëó÷åïðåëîìëåíèå è àíèçîòðîïèÿ îïòè÷åñêîãî ïîãëîùåíèÿ â ïîðèñòîì êðåìíèè // ÆÝÒÔ. 2007. Ò. 132,âûï. 3.- Ñ. 680-693.238115. Ãîëîâàíü Ë.À., Êàøêàðîâ Ï.Ê., Òèìîøåíêî Â.Þ., Æåëòèêîâ À.Ì.Ãåíåðàöèÿ îïòè÷åñêèõ ãàðìîíèê â íàíîñòðóêòóðàõ ïîðèñòûõ ïîëóïðîâîäíèêîâ // Âåñòíèê Ìîñêîâñêîãî óíèâåðñèòåòà.
Ñåð. 3. Ôèçèêà.Àñòðîíîìèÿ. 2005. 2. Ñ. 31-40.116. Tiginyanu I. M., Kravetsky I. V., Langa S., Marowsky G., Monecke J.,Foll H. Porous IIIV compounds as nonlinear optical materials // Phys.Stat. Sol. (a). 2003. V. 197, No. 2. P. 549 555117. Mel'nikov V.A., Golovan L.A., Konorov S.O., Muzychenko D.A., FedotovA.B., Zheltikov A.M., Timoshenko V.Yu., Kashkarov P.K. Secondharmonic generation in strongly scattering porous gallium phosphide //Applied Physics B.
2004, V. 79, No. 2. P. 225 - 228.118. Øåí È.Ð. Ïðèíöèïû íåëèíåéíîé îïòèêè. Ì.: Íàóêà, 1989. 560 c.119. Ìåëüíèêîâ Â.À., Ë.À. Ãîëîâàíü Ë.À., Òèìîøåíêî Â.Þ., ÊàøêàðîâÏ.Ê., Ãàâðèëîâ Ñ.À., Êðàâ÷åíêî Ä.À., Ïàðõîìåíêî Þ.Í., ÑêðûëåâàÅ.À.. Îïòè÷åñêàÿ àíèçîòðîïèÿ è ôîòîííàÿ çàïðåùåííàÿ çîíà â ñëîÿõïîðèñòîãî îêñèäà àëþìèíèÿ // Âåñòíèê Ìîñêîâñêîãî óíèâåðñèòåòà,Ñåð. Ôèçè÷åñêàÿ. 2003, 4.
C.43-47.unzner N., Kovalev D., Gross E., Timoshenko V. Yu., Polisski120. Diener J., KG. , Koch F. Dichroic Bragg reectors based on birefringent porous silicon// Appl. Phys. Lett. 2001. V. 78, No. 24. P. 38873889.121. Kashkarov P. K., Golovan L. A ., Fedotov A. B., Emova A. I., KuznetsovaL.
P., Timoshenko V. Yu., Sidorov-Biryukov D. A., Zheltikov A. M.,Haus J. W. Photonic bandgap materials and birefringent layers basedon anisotropically nanostructured silicon // J. Opt. Soc. Am. B. 2002.V. 19, No. 9. P. 2273-2281122. Golovan L. A.,Kashkarov P. K., Syrchin M. S., Zheltikov A. M. OneDimensional Porous-Silicon Photonic Band-Gap Structures with Tunable239Reection and Dispersion // Physica Status Solidi (a). 2000. V. 182.P. 437-442.123.
Kruger M., Hilbrich S., Thonissen M., Scheyen D., Theiß W., Luth H.Suppression of ageing eects in porous silicon interference lters // Opt.Comm.1998. V. 146, No. 1. P. 309 - 315.124. Èñèìàðó À. Ðàñïðîñòðàíåíèå è ðàññåÿíèå âîëí â ñëó÷àéíî íåîäíîðîäíûõ ñðåäàõ. Ò. 1 Ì: Ìèð, 1981. 280 ñ.125. Anderson P. W. Absence of diusion in certain random lattices // Phys.Rev. 1958. V. 109, No. 5. P.
1492-1505.126. Anderson P. W. The question of classical localization. A theory of whitepaint? // Philos. Mag. 1985. V. 52. P.505-511.127. Kramer B., MacKinnon A. Localization: theory and experiment // Rep.Prog. Phys. 1993. V. 56. P. 1469-1564.128. John S., Stephen M. J.
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