Принципы нанометрологии (1027623), страница 63
Текст из файла (страница 63)
The offset between the centre of the retroreflector and the probe centre is kept as small as possible, in order to minimize the Abbe error in the linearity determination. Care must also be takento minimize the cosine errors during the linearity calibration. Alignment byeye is good enough for large-scale CMMs, but for miniature CMMs with theirincreased accuracy goal, special measures have to be taken. For the calibration of the F25 a position-sensitive detector (PSD) has been used for alignment [54].
The return laser beam is directed onto the PSD and the run-outover the 100 mm stroke reduced to a few micrometres. This translates intoless than 1 nm of cosine error over the full travel.Straightness and rotations can be measured with straightness and rotational optics respectively.
Because of the special construction of the F25,some errors are dependent on more than one coordinate. The platformholding the z axis moves in two dimensions on a granite table. This meansthat instead of two separate straightness errors, there is a combinedstraightness, which is a function of both x and y. The same holds for therotations around the x and y axes. This complicates the calibration, bymaking it necessary to measure the straightness and rotations of the platform along several lines, divided over the measuring volume.The results of the laser interferometer calibration can be used to establishwhat is commonly referred to as a computer-aided accuracy (CAA) correctionfield.
Figure 9.12 shows the results of a laser interferometer measurementof straightness (xTx) on the F25 with the CAA correction enabled [54].FIGURE 9.12 Straightness (xTx) measurement of the F25 with the CAA correctionenabled.ReferencesIn this case, there was a half-year period between the two measurements.The remaining error is a result of the finite accuracy of the original set ofmeasurements used to calculate the CAA field, the finite accuracy of thesecond set of measurements and the long-term drift of the instrument. Themaximum linearity error is 60 nm.The squareness calibration of the F25 cannot be carried out with a laserinterferometer, so an artefact is used. During this measurement a partialCAA correction is active, based on the laser interferometer measurementsonly.
The artefact measurement consists of measuring a fixed length in twoorientations. For the xy squareness, one of these measurements will be alongthe xy diagonal, the other in an orientation rotated 180 around the y axis.The squareness can then be calculated from the apparent length differencebetween the two orientations. The artefact can be a gauge block, but it isbetter to use an artefact where the distance is between two spheres, since theprobe radius does not affect the measurement. Because the principle of thesquareness calibration is based upon two measurements of the same length,it is particularly important that this length does not drift between themeasurements.
In order to get a squareness value which applies to the wholemeasurement volume, the two spheres should be as far apart as possible andplaced symmetrically within the measurement volume.9.7 References[1] Bosch J A 1995 Co-ordinate measuring machines and systems (CRC Press)[2] Flack D R, Hannaford J 2005 Fundamental good practice in dimensionalmetrology NPL Good practice guide No. 80 (National Physical Laboratory)[3] ISO 10360 part 1: 2000 Geometrical product specifications (GPS) Acceptance and reverification tests for coordinate measuring machines(CMM) - Part 1: Vocabulary (International Organization for Standardization)[4] Flack D R 2001 CMM probing NPL Good practice guide No. 43 (NationalPhysical Laboratory)[5] ISO 10360 part 6: 2001 Geometrical product specifications (GPS) Acceptance and reverification tests for coordinate measuring machines(CMM) - Part 6: Estimation of errors in computing Gaussian associatedfeatures (International Organization for Standardization)[6] Barakat N A, Elbestawi M A, Spence A D 2000 Kinematic and geometricerror compensation of coordinate measuring machines Int.
J. Machine ToolsManufac. 40 833–850[7] Satori S, Zhang G X 2007 Geometric error measurement and compensationof machines Ann. CIRP 44 599–609285286C H A P T ER 9 : Coordinate metrology[8] Schwenke H, Knapp W, Haitjema H, Weckenmann A, Schmitt R,Delbressine F 2008 Geometric error measurement and compensation formachines - an update Ann. CIRP 57 660–675[9] Lee E S, Burdekin M 2001 A hole plate artifact design for volumetric errorcalibration of a CMM Int. J. Adv. Manuf. Technol. 17 508–515[10] Schwenke H, Franke M, Hannaford J, Kunzmann H 2005 Error mapping ofCMMs and machine tools by a single tracking interferometer Ann. CIRP 54475–478[11] ISO 10360 part 2: 2009 Geometrical product specifications (GPS) - Acceptance and reverification tests for coordinate measuring machines (CMM) Part 2: CMMs used for measuring size (International Organization forStandardization)[12] ISO 10360 part 3: 2000 Geometrical Product Specifications (GPS) - Acceptance and reverification tests for coordinate measuring machines (CMM) Part 3: CMMs with the axis of a rotary table as the fourth axis (InternationalOrganization for Standardization)[13] ISO 10360 part 4: 2000 Geometrical Product Specifications (GPS) - Acceptance and reverification tests for coordinate measuring machines (CMM) Part 4: CMMs used in scanning measuring mode (International Organizationfor Standardization)[14] ISO 10360 part 5: 2000 Geometrical Product Specifications (GPS) Acceptance and reverification tests for coordinate measuring machines(CMM) - Part 5: CMMs using multiple-stylus probing systems (InternationalOrganization for Standardization)[15] ISO/TS 15530 part 3: 2004 Geometrical product specifications (GPS) Coordinate measuring machines (CMM): Technique for determining theuncertainty of measurement - Part 3: Use of calibrated workpieces or standards (International Organization for Standardization)[16] ISO/TS 15530 part 4: 2008 Geometrical product specifications (GPS) Coordinate measuring machines (CMM): Technique for determining theuncertainty of measurement - Part 4: Evaluating CMM uncertaintyusing task specific simulation (International Organization forStandardization)[17] Balsamo A, Di Ciommo M, Mugno R, Rebaglia B I, Ricci E, Grella R 1999Evaluation of CMM uncertainty through Monte Carlo simulations Ann.CIRP 48 425–428[18] Takamasu K, Takahashi S, Abbe M, Furutani R 2008 Uncertainty estimationfor coordinate metrology with effects of calibration and form deviation instrategy of measurement Meas.
Sci. Technol. 19 84001[19] van Dorp B, Haitjema H, Delbressine F, Schellekens P 2002 The virtualCMM method for three-dimensional coordinate machines Proc. 3rd Int.euspen Conf., Eindhoven, Netherlands, May 633–636[20] Haitjema H, van Dorp B, Morel M, Schellekens P H J 2001 Uncertaintyestimation by the concept of virtual instruments Proc. SPIE 4401147–158References[21] Peggs G N, Lewis A J, Oldfield S 1999 Design for a compact high-accuracyCMM Ann. CIRP 48 417–420[22] Hasen H N, Carniero K, Haitjema H, De Chiffre L 2006 Dimensional microand nano metrology Ann.
CIRP 55 721–743[23] Ruijl T A M, van Eijk J 2003 A novel ultra precision CMM based onfundamental design principles Proc. ASPE, UNCC, USA, June[24] Fan K C, Fei Y T, Yu X F, Chen Y J, Wang W L, Chen F, Liu Y S 2006Development of a low-cost micro-CMM for 3D micro/nano measurementsMeas. Sci.
Technol. 17 524–532[25] Küng A, Meli F, Thalmann R 2007 Ultraprecision micro-CMM using a lowforce 3D touch probe Meas. Sci. Technol. 18 319–327[26] van Seggelen J K, Roseille P C J N, Schellekens P H J, Spaan H A M,Bergmans R H, Kotte G J W L 2005 An elastically guided machine axis withnanometer repeatability Ann. CIRP 54 487–490[27] Vermeulen M, Rosielle P C J N, Schellekens P H J 1998 Design of a highprecision 3D-coordinate measuring machine Ann. CIRP 47 447–450[28] Jäger G, Grunwald R, Manske E, Housotte T 2004 A nanopositioning andnanomeasuring machine, operation, measured results Nanotechnology andPrecision Engineering 2 81–84[29] Jäger G, Manske E, Housotte Scott W 2002 Operation and analysis ofa nanopositioning and nanomeasuring machine Proc.
ASPE, St. Louis,Missouri, USA 229–304[30] Weckenmann A, Estler T, Peggs G, McMurty D 2004 Probing systems indimensional metrology Ann. CIRP 53 657–684[31] Meli F, Küng A 2007 AFM investigation of surface damage caused bymechanical probing with small ruby spheres Meas. Sci.
Technol. 18 486–502[32] van Vliet W, Schellekens P 1996 Accuracy limitations of fast mechanicalprobing Ann. CIRP 45 483–487[33] Hoffmann J, Weckenmann A, Sun Z 2008 Electrical probing for dimensionalmicro metrology Ann. CIRP 57 59–62[34] Haitjema H, Pril W, Schellekens P 2001 Development of a silicon-basednanoprobe system for 3-D measurements Ann. CIRP 50 365–368[35] Brand U, Kleine-Besten T, Schwenke H 2000 Development of a specialCMM for dimensional metrology on microsystem components Proc. 15thASPE, Scotsdale, Arizona, USA, Oct.
1–5[36] Pril W O 2002 Development of high precision mechanical probes for coordinate measuring machines (PhD Thesis: Technical University ofEindhoven)[37] Kim B, Masuzawa T, Bourina T 1999 The vibroscanning method for themeasurement of micro-hole profiles Measurement 10 697–705[38] Schwenke H, Wäldele F, Weiskirch C, Kunzmann H 2001 Opto-tactile sensorfor 2D and 3D measurement of small structures on coordinate measuringmachines Ann.
CIRP 50 381–364287288C H A P T ER 9 : Coordinate metrology[39] Stone J A, Muralikrishnan B, Stoup J R 2005 A fiber probe for CMMmeasurement of small features Proc. SPIE 5879 58790R[40] Thelen R, Schultz J, Meyer P, Saile V 2008 Approaching a sub-microncapability index using Werth fiber probe Proc. 4M Conf., Cardiff, UK, Oct.147–150[41] Bauza M B, Hocken R J, Smith S T, Woody S C 2005 Development ofa virtual probe tip with an application to high aspect ratio microscale featuresRev. Sci.
Instrum. 76 095112[42] Stoyanov S, Bailey C, Leach R K, Hughes E B, Wilson A, O’Neil W, Dorey R A,Shaw C, Underhill D, Almond H J 2008 Modelling and prototyping theconceptual design of a 3D CMM micro-probe 2nd Electronics System Integration Technology Conference, Greenwich, UK 193–198[43] Peiner E, Balke M, Doering L, Brand U 2008 Tactile probes for dimensionalmetrology with microcomponents at nanometre resolution Meas.
Sci.Technol. 19 064001[44] Dai G, Wolff H, Weimann T, Xu M, Pohlenz F, Danzelbrink H-U 2007Nanoscale surface measurements at sidewalls of nano- and micro-structuresMeas. Sci. Technol. 18 334–341[45] Chen L-C 2007 Automatic 3D surface reconstruction and sphericitymeasurement of micro spherical balls of miniaturized coordinate measurement probes Meas.