Диссертация (1149831), страница 10
Текст из файла (страница 10)
Phys. — 2000. — Vol. 33. — P. 2890–2898.34. Computational investigation of the accuracy of constant-dC scanning capacitance microscopy for ultra-shallow doping profile characterization / Ciampolini L., Ciappa M., Malberti P., Fichtner W. // Solid State Electron. — 2001.— Vol. 46(3). — Pp. 445–449.35. Marchiando J. F., Kopanski J.
J. The lateral resolution limit for imaging periodic conducting surfaces in capacitive microscopy // J. Appl. Phys. — 2002. —Vol. 92. — P. 5798—5809.36. Knox A.R., Asenov A., Lowe A.C. An electron emission model for use with 3Delectromagnetic finite element simulation // Solid-State Electronics. — 2001.— Vol. 45, no. 6. — Pp. 841 – 851.37.
Determining the work function of a carbon-cone cold-field emitter by in situelectron holography / Ludvig de Knoop, Florent Houdellier, Christophe Gatelet al. // Micron. — 2014. — Vol. 63, no. 0. — Pp. 2 – 8. — David J.H. Cockayne.38. New Computer Simulation Software of Electron Trajectories for Evaluation ofMagnetic Field Immersion-Type Field Emission Gun / Tamura K., Ikuta T.,106Shimizu R., Ichihashi M.
// Japanese J.of Appl.Phys. — 2007. — Vol. 46(2).— P. 834—837.39. Simulation studies of self-focusing carbon nanotube field emitter / Ko Pin Liao,Yuan Hu, Tsang-Lang Lin, Yung-Chiang Lan // J Vac Sci Technol B. — 2007.— Vol. 25(2). — P. 484—492.40.
Lan Y. C., Yan M., Liu W. J. Screen effects on field emission from an array ofone-dimensional nanostructures grown on silicon substrates: A simulation studyusing classical transport model // J. Vac. Sci. Techno. B. — 2007. — Vol. 25(2).— P. 497—503.41. Li Y., Yeh T. C. Three-dimensional simulation of field emission triode structureusing carbon-nanotube emitters // Journal of Computational Electronics. —2008. — Vol.
7. — P. 332—336.42. Simulation study of carbon nanotube field emission display with under-gateand planar-gate structures / Lan YC, Lee CT, Hu Y. et al. // J. Vac. Sci.Technol. B. — 2004. — Vol. 22(3). — P. 1244—1249.43. Wei Lei, Baoping Wang, Hanchun Yin. Simulation of field emitter array indiode model // Nuclear Instruments and Methods in Physics Research SectionA: Accelerators, Spectrometers, Detectors and Associated Equipment. — 1999.— Vol. 423. — P.
213—222.44. Simulations of Fabricated Field Emitter Structure / Hong D., Aslam M.,Olinger M., Feldmann M. // J. Vac. Sci. Technol. B. — 1994. — Vol. 12(2). —P. 764—769.45. Snyder P. G., Cho S.-J. Investigation of citric acid-hydrogen peroxide etchedGaAs and Al0.3Ga0.7As surfaces by spectroscopic ellipsometry // Journal ofVacuum Science and Technology B. — 1998. — Vol. 16(5). — P. 2680—2685.10746. Simulation of field emission behavior from multiple carbon nanotubes inan integrated gate triode configuration / Mamta Khaneja, Santanu Ghosh,P.K.
Chaudhury, Vikram Kumar // Physica E: Low-dimensional Systems andNanostructures. — 2014. — Vol. 63, no. 0. — Pp. 268 – 271.47. Egorov N.V., Almazov A.A. Optimization of multi-tip field emission electronsource // Vacuum. — 1999. — Vol. 52, no. 3. — Pp. 295 – 300.48. Kim Hyun Suk, Castro Edward Joseph D., Lee Choong Hun. Effect of a concavegrid mesh in a carbon nanotube-based field emission X-ray source // MaterialsResearch Bulletin. — 2014. — Vol. 58, no. 0.
— Pp. 107 – 111. — Proceedingsof the {IFFM2013} - Vol. 1: Fundamentals of the functional materials and Vol.2: Applications of the functional materials.49. Sise Omer. Electrostatic afocal-zoom lens design using computer optimizationtechnique // Journal of Electron Spectroscopy and Related Phenomena. —2014. — Vol. 197, no.
0. — Pp. 7 – 12.50. Syms R.R.A., Michelutti L., Ahmad M.M. Two-dimensional microfabricatedelectrostatic einzel lens // Sensors and Actuators A: Physical. — 2003. — Vol.107, no. 3. — Pp. 285 – 295.51. Kanaji T, Urano T, Hongo S. Experimental results of cascade static lensgauge // Vacuum. — 1993. — Vol. 44, no. 5–7. — Pp. 581 – 582. — Special IssueSelected Proceedings of the 12th International Vacuum Congress (IVC-12) 8thInternational Conference on Solid Surfaces (ICSS-8).52. Marianowski Karin, Ohnweiler Timm, Plies Erich. Experimental results usingan improved low-energy focussed ion beam column with booster principle andfree-standing target // Optik - International Journal for Light and ElectronOptics. — 2014.
— Vol. 125, no. 12. — Pp. 2954 – 2958.10853. Tromp R.M. Measuring and correcting aberrations of a cathode objectivelens // Ultramicroscopy. — 2011. — Vol. 111, no. 4. — Pp. 273 – 281.54. Konvalina I., Müllerová I. Properties of the cathode lens combined with a focusing magnetic/immersion-magnetic lens // Nuclear Instruments and Methods inPhysics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.
— 2011. — Vol. 645, no. 1. — Pp. 55 – 59. — The EighthInternational Conference on Charged Particle Optics.55. Design of a novel electrostatic ion storage ring at {KACST} / M.O.A. El Ghazaly, S.M. Alshammari, C.P. Welsch, H.H. Alharbi // Nuclear Instruments andMethods in Physics Research Section A: Accelerators, Spectrometers, Detectorsand Associated Equipment. — 2013. — Vol. 709, no. 0. — Pp. 76 – 84.56. Kleinknecht H.P., Sandercock J.R., Meier H. An experimental scanning capacitance microscope // Scanning Microscopy. — 1988. — Vol.
2. — Pp. 1839–1844.57. Williams C.C., Hough W.P., Rishton S.A. Scanning capacitance microscopy ona 25 nm scale // Appl. Phys. Lett. — 1989. — Vol. 55. — P. 203–205.58. Kyritsakis A., Xanthakis J.P. Beam spot diameter of the near-field scanningelectron microscopy // Ultramicroscopy. — 2013.
— Vol. 125, no. 0. — Pp. 24– 28.59. Details of 1pi sr wide acceptance angle electrostatic lens for electron energyand two-dimensional angular distribution analysis combined with real spaceimaging / László Tóth, Hiroyuki Matsuda, Fumihiko Matsui et al. // NuclearInstruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.
— 2012. — Vol. 661, no. 1. —Pp. 98 – 105.10960. iDEEAA: A novel, versatile apparatus for electron spectroscopy / C. Lupulescu,T. Arion, U. Hergenhahn et al. // Journal of Electron Spectroscopy and RelatedPhenomena. — 2013. — Vol. 191, no. 0. — Pp. 104 – 111.61. Influence of parameters of field-emission cathodoluminescence light sources ontheir technical properties / M.O Popov, S.Yu Bulakhov, A.V Karpov et al. //Applied Surface Science. — 2003.
— Vol. 215, no. 1–4. — Pp. 253 – 259. —{IVESC} 2002.62. Diamond vacuum field emission devices / W.P. Kang, J.L. Davidson,A. Wisitsora-at et al. // Diamond and Related Materials. — 2004. — Vol. 13, no.11–12. — Pp. 1944 – 1948. — Proceedings of the 9th International Conferenceon New Diamond Science and Technology (ICNDST-9).63. Kim Hyun Suk, Castro Edward Joseph D., Lee Choong Hun. Optimum designfor the carbon nanotube based micro-focus X-ray tube // Vacuum. — 2015.
—Vol. 111, no. 0. — Pp. 142 – 149.64. Optimization of the electrostatic and magnetic field configuration in the {MITICA} accelerator / G. Chitarin, P. Agostinetti, H.P.L. de Esch et al. // FusionEngineering and Design. — 2013. — Vol. 88, no. 6–8. — Pp. 507 – 511. —Proceedings of the 27th Symposium On Fusion Technology (SOFT-27); Liège,Belgium, September 24-28, 2012.65.
Modeling and simulation for the field emission of carbon nanotubes array /X.Q. Wang, M. Wang, H.L. Ge et al. // Physica E: Low-dimensional Systemsand Nanostructures. — 2005. — Vol. 30, no. 1–2. — Pp. 101 – 106.66. Influence of electric field and emission current on the configuration of nanotubes in carbon nanotube layers / N.A. Kiselev, A.L. Musatov, E.F. Kukovitskii et al. // Carbon. — 2005.
— Vol. 43, no. 15. — Pp. 3112 – 3123.11067. Okuyama Fumio. Electron microscopic observation of the shape of field emissioncathode tips // Surface Science. — 1970. — Vol. 22, no. 1. — Pp. 1 – 11.68. Large area deposition of field emission cathodes for flat panel displays /Alan Jankowski, Jeffrey Hayes, Jeffrey Morse, James Ferreira // Thin SolidFilms.
— 1999. — Vol. 355–356, no. 0. — Pp. 194 – 198.69. Stetsenko B.V., Shchurenko A.I. On relationship between the field at an autoemitter top, anode voltage and cathode geometry // Solid-State Electronics.— 2011. — Vol. 56, no. 1. — Pp. 35 – 39.70. Can we reliably estimate the emission field and field enhancement factor of carbon nanotube film field emitters / Jean-Marc Bonard, Mirko Croci, Imad Arfaoui et al. // Diamond and Related Materials. — 2002. — Vol.















