Локальная оптическая микроскопия и поляриметрия ближнего поля для исследования оптических свойств поверхностных наноструктур (1103540), страница 7
Текст из файла (страница 7)
№ 15. 10 с.Ejov A.A., Kalachev A.I., Kaporsky L.N., Muzychenko D.A., SmirnovI.B., Veiko V.P., Voznessenski N.B., Yakovlev E.B. Peculiarities oflaser-assisted drawing-out processing of optical probes for SNOM //Proceedings of SPIE: Computer-Controlled Microshaping. V.P.
Veiko, T.Szoerenyi, Ed. 1999. V.3822. P. 199–206.Ejov A.A., Magnitskii, S.A., Muzychenko, D.A., Panov, V.I. Nearfield optical microscopy of the elements of optical memory // SurfaceInvestigation. X-Ray, Synchrotron and Neutron Techniques. 2001. V.16,№ 7. P.
1101–1107.Ezhov A.A., Magnitskii S.A., Muzychenko D.A., et al. Scanning nearfield optical microscopy study of electromagnetic field localizationon periodical structures and defects // Surface Investigation. X-Ray,Synchrotron and Neutron Techniques.
2001. V.16, № 11. P. 1761–1767.Ezhov A.A., Logginov A.S., Muzychenko D.A., et al. Scanning near-fieldoptical microscopy of iron garnet films // Surface Investigation. X-Ray,Synchrotron and Neutron Techniques. 2001. V.16, № 11. P. 1755–1759.Ejov A.A., Muzychenko D.A., Toursynov J.S. SNOM investigation ofmolecular luminescence and polarize properties of domain walls // Phys.Low-Dim.
Struct. 2001. No. 3/4, P. 237–242.Ezhov A.A., Logginov A.S., Muzychenko D.A., et al. Scanning nearfield optical microscopy as a new tool for subwavelength-resolutionmagnetooptical investigations // Physics of Metals and Metallography.2001. V. 92. P. S277–S282.Didenko N.V., Kim E.M., Muzychenko D.A., et al. Silver island filmsprobed by hyper-Rayleigh scattering and atomic force microscopy //Applied Physics B: Lasers and Optics. 2002. V.74, Nos.(7–8), pp. 647–651.Bashevoy M.V., Ezhov A.A., Magnitskii S.A., Muzychenko D.A., etal. SNOM investigation of the electromagnetic field intensity andpolarization distribution in the vicinity of nanostructures // Int. Journalof Nanoscience.
2004. V. 3, Nos. 1 & 2, P. 105–113.Bashevoy M.V., Ezhov A.A., Magnitskii S.A., Malakhov D.V.,Muzychenko D.A., Panov V.I., Toursynov J.S. SNOM investigation ofthe electromagnetic field intensity and polarization distribution in thevicinity of subwavelenhgth structures // Proceedings of SPIE: LaserAssisted Micro- and Nanotechnologies. V.P. Veiko Editor. 2003. V.5399.2004. P. 38–49.Bashevoy M.V., Ezhov A.A., Magnitskii S.A., Muzychenko D.A.,Panov V.I., Toursynov J.S. Local optical diagnostics of nanostructures.SNOM investigation of the electromagnetic field interaction with thenanostructures // Proceedings of SPIE: Micro- and Nanoelectronics.
K.A.Valiev, A.A. Orlikovsky, Ed. 2004. V. 401. P. 561–572.2813. Ежов А.А., Магницкий С.А., Музыченко Д.А., Панов В.И. Применение сканирующей оптической микроскопии ближнего поля для изучения субмикро- и нанообъектов, а также распределения электромагнитного поля // Наукоемкие технологии. 2005. Т. 6, № 1. С. 34–40.14. Ezhov A.A., Magnitsky S.A., Maslova N.S., Muzychenko D.A., NikulinA.A., Panov V.I. Surface-plasmon vortices in nanostructured metallicfilms // Письма в ЖЭТФ. 2005.
Т. 82, Вып. 9-10. С. 678–681.15. Ezhov A.A., Magnitskii S.A., Maslova N.S., Muzychenko D.A., NikulinA.A., Panov V.I. Near-field optical vortexes at nanostructured metallicfilms // Int. Journal of Nanoscience. 2007. V. 6, Nos. 3 & 4. P. 233–236.[1][2][3][4][5][6][7][8][9][10][11][12][13][14]Список цитируемой литературыG. Binnig, H.
Rohrer. Scanning tunneling microscopy // Helv. Phys. Acta.1982. Vol. 55. No. 6. P. 726–735.G. Binnig, C.F. Quate, Ch. Gerber. Atomic force microscope // Phys.Rev. Lett. 1986. Vol. 56. No. 9. P. 930–933.A. Lewis, et al. Scanning optical microscopy with 500 A spatial resolution// Biophys. J. 1983. Vol. 41. P.
405a.D.M. Eigler and E.K. Schweizer. Positioning single atoms with a scanningtunneling microscope // Nature. 1990. Vol. 344. P. 524.P.H. Beton, A.W. Dunn, and P. Moriarty. Manipulation of C60 moleculeson a Si surface // Appl. Phys. Lett. 1995. Vol. 67. P.1075.E.A. Synge. A suggested method for extending microscopic resolution intothe ultra-microscopic region // Philosophical Mag. 1928. Vol. 6. p.
356.E. A. Ash, G. Nicholls. Super-resolution aperture scanning microscope //Nature. 1972. Vol. 237. P. 510–512.D. W. Pohl, W. Denk, M. Lanz. Optical stethoscopy: image recording withresolution λ/20 // Appl. Phys. Lett. 1984. Vol. 44. No. 7. P. 651–653.A. Lewis, et al. Development of a 500 A spatial resolution light microscope// Ultramicroscopy. 1984. Vol. 13. P. 227–231F. Zenhausern, et al.
Scanning interferometric apertureless microscopy:optical imaging at 10 angstrom resolution // Science. 1995. Vol. 269, No.8. P. 1083–1085.H.A. Bethe. Theory of Diffraction by Small Holes // Phys. Rev. 1944. Vol.66. P. 163.K. Karrai, R.D. Grober. Piezoelectric tip-sample distance control for nearfield optical microscopes // Appl. Phys.
Lett. 1995. Vol. 66, No. 14. P.1842–1844.Kane Yee. Numerical solution of initial boundary value problems involvingMaxwell’s equations in isotropic media // IEEE Transactions on Antennasand Propagation. 1966. V. 14, No. 3. P. 302-–307Y. Leviatan. Study of near-field of a small aperture // J. Appl. Phys. 1986.Vol. 60. No. 5. P.
1577–1583..
![](https://s.studizba.com/z.php?f=/templates/si/i/noavatar.png&w=100&h=100&t=1"){kind=avatar}
